ION-INDUCED SECONDARY ELECTRON EMISSION FROM 58Ni AND 60Ni: EVIDENCE OF SECONDARY ELECTRONS GENERATED BY THE RECOILING TARGET ATOMS
DOI:
https://doi.org/10.71330/thenucleus.2010.882Abstract
We have measured the secondary electron yield of clean 58Ni and 60Ni bombarded with 2-10 keV Ar + ions. It was found that secondary electron yield of 58Ni is consistently high as compared to the 60Ni. This result is not in line with the most theoretical model of kinetic electron emission, which predict strict proportionality between secondary electron yield and electronic stopping power. We have demonstrated that the measured secondary electron yield is also related to the nuclear stopping power. We thus conclude that higher secondary electron yield of 58Ni is due to the larger contribution of the recoiling target atoms to the secondary electron yield.References
D. Hasselkamp, in: Particle Induced Electron
Emission II, Eds. G. Höhler and E.A.
Niekisch, Vol. 123, Springer, Heidelberg,
R.A. Baragiola, Nucl. Instr. Meth. B 78
(1993) 223.
E.J. Sternglass, Phys. Rev. 108 (1957) 1.
G. Holmén, B. Svensson, J. Schou and P.
Sigmund, Phys. Rev. B 20 (1979) 2247.
J. Schou, Phys. Rev. B 22 (1980) 2141.
O. Benka, E. Steinbauer and P. Bauer, Nucl.
Instr. Meth. B 90 (1994) 64.
H. Rothard, K. Kroneberger, E. Veje, A.
Clouvas, P. Lorenzen, N. Keller, J. Kemmler,
W. Meckbach and K.O. Groeneveld, Phys.
Rev. A 41 (1990) 2521.
H. Jacobsson and G. Holmén, Phys. Rev. B
(1994) 1789.
H.J. Frischkorn and K.O. Groeneveld,
Physica Scripta, T 6 (1983) 89.
H. Rothard, K. Kroneberger, M. Burkhard, J.
Kemmler, P. Koschar, O. Heil, C.
Biedermann, S. Lencinas, N. Keller, P.
Lorenzen, D. Hofmann, A. Clouvas, K.O.
Groeneveld and E. Veje, Radiation Effects
and Defects in Solids, 109 (1989) 281.
B. Svensson and G. Holmén, J. Appl. Phys.
(1981) 6928.
A.H. Dogar, Shakir Ullah and A. Qayyum,
Nucl. Instr. Meth. B 260 (2007) 525.
H. Eder, W. Messerschmidt, H.P. Winter and
F. Aumayr, J. Appl. Phys., 87 (2000) 8198.
L.M. Kishinevskii, Radiat. Eff. 19 (1973) 23.
K. Ohya, Nucl. Instr. Meth. B 195 (2002) 281.
K. Ohya and T. Ishitani, Applied Surface
Science, 237 (2002) 606.
S. Ullah, A.H. Dogar and A. Qayyum, Eur.
Phys. J. Appl. Phys. 44 (2008) 235.
J.F. Ziegler, SRIM 2008, http:// www.
srim.org/.
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